Author of the publication

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time.

, , , and . J. Electron. Test., 32 (3): 315-328 (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

On-chip aging sensor to monitor NBTI effect in nano-scale SRAM., , , and . DDECS, page 354-359. IEEE, (2012)Characterization and Test of Intermittent Over RESET in RRAMs., , , , , , , , and . ATS, page 1-6. IEEE, (2023)Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs., , , , and . LATS, page 1-6. IEEE, (2018)Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects., , , , , and . LATS, page 1-6. IEEE, (2020)Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects., , , , and . J. Electron. Test., 35 (2): 191-200 (2019)NBTI-aware design of integrated circuits: a hardware-based approach., , , and . LATS, page 1-6. IEEE Computer Society, (2015)Analyzing NBTI impact on SRAMs with resistive-open defects., , , , and . LATS, page 87-92. IEEE, (2016)SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic., , , , , , and . DDECS, page 223-228. IEEE Computer Society, (2015)Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs., , , , , and . LATS, page 1-6. IEEE, (2024)NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time., , , and . J. Electron. Test., 32 (3): 315-328 (2016)