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Static test compaction for diagnostic test sets of full-scan circuits., и . IET Comput. Digit. Tech., 4 (5): 365-373 (2010)Same/different fault dictionary: an extended pass/fail fault dictionary with improved diagnostic resolution., и . IET Comput. Digit. Tech., 3 (1): 85-93 (2009)Sizes of test sets for path delay faults using strong and weak non-robust tests., и . IET Comput. Digit. Tech., 5 (5): 405-414 (2011)Primary input cones based on test sequences in synchronous sequential circuits., и . IET Comput. Digit. Tech., 5 (1): 16-24 (2011)Test compaction methods for transition faults under transparent-scan., и . IET Comput. Digit. Tech., 3 (4): 315-328 (2009)Augmented Shuffle-Exchange Multistage Interconnection Networks., и . Computer, 20 (6): 30-40 (1987)Robust tests for parity trees., и . J. Electron. Test., 1 (3): 191-200 (1990)On fault equivalence, fault dominance, and incompletely specified test sets., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (8): 1271-1274 (2005)On path selection in combinational logic circuits., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 8 (1): 56-63 (1989)Finite memory test response compactors for embedded test applications., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (4): 622-634 (2005)