( en | de | ru )

 

Disambiguation of "Crouch, Alfred L."

Author of the publication

copydeleteadd this publication to your clipboard
Board security enhancement using new locking SIB-based architectures.

, , , and . ITC, page 1-10. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Carly L Crouch

James Crouch

Alfred L Schumacher

James Crouch

Stephen Crouch

 

Other publications of authors with the same name

Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip., , , , , and . ITC, page 1-10. IEEE Computer Society, (2007)Future Trends in Test: The Adoption and Use of Low Cost Structural Testers.. ITC, page 698-703. IEEE Computer Society, (2004)Innovate Practices on CyberSecurity of Hardware Semiconductor Devices., , , , , , , , , and 4 other author(s). VTS, page 1. IEEE, (2019)The testability features of the 3rd generation ColdFire family of microprocessors., , , , and . ITC, page 913-922. IEEE Computer Society, (1999)Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution., , and . ITC, page 660-669. IEEE Computer Society, (1994)Processing High Volume Scan Test Results for Yield Learning., , and . ISQED, page 293-298. IEEE Computer Society, (2007)Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox., , , , , and . ITC, page 1-10. IEEE Computer Society, (2012)Optimization trade-offs for vector volume and test power., and . ITC, page 873-881. IEEE Computer Society, (2000)BA-BIST: Board test from inside the IC out., and . ITC, page 1. IEEE Computer Society, (2013)Detecting a trojan die in 3D stacked integrated circuits., , , , , and . NATW, page 1-6. IEEE, (2017)