From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2007)Future Trends in Test: The Adoption and Use of Low Cost Structural Testers.. ITC, стр. 698-703. IEEE Computer Society, (2004)Innovate Practices on CyberSecurity of Hardware Semiconductor Devices., , , , , , , , , и 4 other автор(ы). VTS, стр. 1. IEEE, (2019)The testability features of the 3rd generation ColdFire family of microprocessors., , , , и . ITC, стр. 913-922. IEEE Computer Society, (1999)Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution., , и . ITC, стр. 660-669. IEEE Computer Society, (1994)Processing High Volume Scan Test Results for Yield Learning., , и . ISQED, стр. 293-298. IEEE Computer Society, (2007)Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2012)Optimization trade-offs for vector volume and test power., и . ITC, стр. 873-881. IEEE Computer Society, (2000)BA-BIST: Board test from inside the IC out., и . ITC, стр. 1. IEEE Computer Society, (2013)Detecting a trojan die in 3D stacked integrated circuits., , , , , и . NATW, стр. 1-6. IEEE, (2017)