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A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement.

, , , , , , , , , , , , , и . ISQED, стр. 16-23. IEEE, (2014)

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Makoto Yamamoto

Makoto Nakamura

Makoto Arai

Makoto Ida

Makoto Kobayashi

 

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