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Influence of charge balance on the robustness of trench-based super junction diodes.

A. Villamor-Baliarda, P. Vanmeerbeek, M. Riccio, V. d'Alessandro, A. Irace, J. Roig, D. Flores, and P. Moens. Microelectron. Reliab., 52 (9-10): 2409-2413 (2012)

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Jan Roigas

Henn Roigas

Constanze Roigas

Mathieu Jaume

Rafel Jaume Deyà

Other publications of authors with the same name

Improved current filament control during Zener diode zapping.J. Roig, J. Lebon, S. Vandeweghe, S. Mouhoubi, and F. Bauwens. Microelectron. Reliab., 52 (9-10): 2368-2373 (2012)Influence of charge balance on the robustness of trench-based super junction diodes.A. Villamor-Baliarda, P. Vanmeerbeek, M. Riccio, V. d'Alessandro, A. Irace, J. Roig, D. Flores, and P. Moens. Microelectron. Reliab., 52 (9-10): 2409-2413 (2012)Switching performance of 65 V vertical N-channel FLYMOSFETs.L. Théolier, K. Isoird, H. Tranduc, F. Morancho, J. Roig, Y. Weber, E. Stefanov, and J. Reynes. Microelectron. J., 39 (6): 914-921 (2008)Optimisation of very low voltage TVS protection devices.J. Urresti, S. Hidalgo, D. Flores, J. Roig, J. Rebollo, and I. Mazarredo. Microelectron. J., 34 (9): 809-813 (2003)Charge-Based Compact Modeling of Multiple-Gate MOSFET.B. Iñíguez, A. Lázaro, H. Elhamid, O. Moldovan, B. Nae, J. Roig, and D. Jiménez. CICC, page 49-56. IEEE, (2007)Lateral punch-through TVS devices for on-chip protection in low-voltage applications.J. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, and J. Rebollo. Microelectron. Reliab., 45 (7-8): 1181-1186 (2005)Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications.J. Roig, D. Flores, S. Hidalgo, J. Rebollo, and J. Millán. Microelectron. J., 35 (3): 291-297 (2004)Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.I. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, and J. Rebollo. Microelectron. Reliab., 45 (3-4): 493-498 (2005)Reduction of self-heating effect on SOIM devices.J. Roig, D. Flores, M. Vellvehí, J. Rebollo, and J. Millán. Microelectron. Reliab., 42 (1): 61-66 (2002)Electric field unbalance for robust floating ring termination.A. Villamor-Baliarda, P. Vanmeerbeek, J. Roig, P. Moens, and D. Flores. Microelectron. Reliab., 51 (9-11): 1959-1963 (2011)

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Disambiguation of "Roig, Jaume"

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Influence of charge balance on the robustness of trench-based super junction diodes.

Please choose a person to relate this publication to

Jan Roigas

Henn Roigas

Constanze Roigas

Mathieu Jaume

Rafel Jaume Deyà

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Roig, Jaume"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Influence of charge balance on the robustness of trench-based super junction diodes.

Please choose a person to relate this publication to

Jan Roigas

Henn Roigas

Constanze Roigas

Mathieu Jaume

Rafel Jaume Deyà

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Influence of charge balance on the robustness of trench-based super junction diodes.