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Test methodologies and design automation for IBM ASICs., , , and . IBM J. Res. Dev., 40 (4): 461-474 (1996)A SmartBIST Variant with Guaranteed Encoding., , , , , and . Asian Test Symposium, page 325-. IEEE Computer Society, (2001)Optimizing Test Data Volume Using Hybrid Compression., , , , and . ATS, page 157-162. IEEE Computer Society, (2008)OPMISR: the foundation for compressed ATPG vectors., , , , , , and . ITC, page 748-757. IEEE Computer Society, (2001)An Economic Analysis and ROI Model for Nanometer Test., , , and . ITC, page 518-524. IEEE Computer Society, (2004)Channel Masking Synthesis for Efficient On-Chip Test Compression., , and . ITC, page 452-461. IEEE Computer Society, (2004)Use of MISRs for compression and diagnostics., and . ITC, page 9. IEEE Computer Society, (2005)Encounter test OPMISR+ on-chip compression.. ITC, page 2. IEEE Computer Society, (2005)Design Automation of Test for the EX/9000TM Series Processors., and . ICCD, page 550-553. IEEE Computer Society, (1991)Using Programmable On-Product Clock Generation (OPCG) for Delay Test., , , and . ATS, page 69-72. IEEE, (2007)