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Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors., , and . ITC, page 1-7. IEEE, (2016)New scan compression approach to reduce the test data volume., , and . IET Comput. Digit. Tech., 15 (4): 251-262 (2021)Cost-Driven Ranking of Memory Elements for Partial Intrusion., and . IEEE Des. Test Comput., 14 (3): 45-50 (1997)The Mutating Metric for Benchmarking Test., , and . IEEE Des. Test Comput., 17 (3): 18-21 (2000)Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction., and . Computer, 32 (11): 42-45 (1999)Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set., , , and . ITC, page 1-7. IEEE, (2017)Enhancing test efficiency for delay fault testing using multiple-clocked schemes., , , , , , and . DAC, page 371-374. ACM, (2002)Historical Perspective on Scan Compression., , and . IEEE Des. Test Comput., 25 (2): 114-120 (2008)Enhancing security of logic encryption using embedded key generation unit., , and . ITC-Asia, page 131-136. IEEE, (2017)A New Logic Encryption Strategy Ensuring Key Interdependency., , , , and . VLSID, page 429-434. IEEE Computer Society, (2017)