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On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up., , , and . J. Electron. Test., 19 (4): 369-376 (2003)A New Algorithm for Dynamic Faults Detection in RAMs., , , and . VTS, page 177-182. IEEE Computer Society, (2005)IEEE Std 1500 Compliant Infrastructure forModular SOC Testing., , and . Asian Test Symposium, page 450. IEEE Computer Society, (2005)The role of test protocols in testing embedded-core-based system ICs., and . ETW, page 70-75. IEEE Computer Society, (1999)An Effective Diagnosis Method to Support Yield Improvement., , , and . ITC, page 260-269. IEEE Computer Society, (2002)Memory Testing Under Different Stress Conditions: An Industrial Evaluation., , , , , and . DATE, page 438-443. IEEE Computer Society, (2005)A structured and scalable mechanism for test access to embedded reusable cores., , , , , and . ITC, page 284-293. IEEE Computer Society, (1998)Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model., , , , , and . VTS, page 345-350. IEEE Computer Society, (2003)Memory Testing Under Different Stress Conditions: An Industrial Evaluation, , , , , and . CoRR, (2007)Wrapper design for embedded core test., , , and . ITC, page 911-920. IEEE Computer Society, (2000)