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Adversarial Perturbation Attacks on ML-based CAD: A Case Study on CNN-based Lithographic Hotspot Detection.

, , , , , , , and . ACM Trans. Design Autom. Electr. Syst., 25 (5): 48:1-48:31 (2020)

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Smart building uncertainty analysis via adaptive Lasso., and . IET Cyper-Phys. Syst.: Theory & Appl., 2 (1): 42-48 (2017)Self-aligned double patterning layout decomposition with complementary e-beam lithography., , and . ASP-DAC, page 143-148. IEEE, (2014)Machine learning and pattern matching in physical design., , , and . ASP-DAC, page 286-293. IEEE, (2015)A high-performance triple patterning layout decomposer with balanced density., , , , , and . ICCAD, page 163-169. IEEE, (2013)EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation., , , and . CoRR, (2014)A High-Performance Triple Patterning Layout Decomposer with Balanced Density., , , , , and . CoRR, (2014)Cross-layer Optimization for High Speed Adders: A Pareto Driven Machine Learning Approach., , , , and . CoRR, (2018)A learning bridge from architectural synthesis to physical design for exploring power efficient high-performance adders., , , and . ISLPED, page 1-6. IEEE, (2017)Adaptive 3D-IC TSV Fault Tolerance Structure Generation., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (5): 949-960 (2019)Methodology for Standard Cell Compliance and Detailed Placement for Triple Patterning Lithography., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (5): 726-739 (2015)