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Disambiguation of "Ryssel, Heiner"

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Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors.

, , , , , and . Microelectron. Reliab., 43 (8): 1253-1257 (2003)

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Heiner Ryssel

Heiner Ryssel

Uwe Ryssel

Heinz Ryssel

Dagmar Ryssel

 

Other publications of authors with the same name

COMPOSITE -- A Complete Modeling Program of Silicon Technology., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 4 (4): 421-430 (1985)Electrical reliability aspects of through the gate implanted MOS structures with thin oxides., , , , and . Microelectron. Reliab., 41 (7): 987-990 (2001)Reliability of ultrathin nitrided oxides grown in low pressure N2O ambient., , and . Microelectron. Reliab., 41 (7): 1089-1092 (2001)Suppression of boron penetration through thin gate oxides by nitrogen implantation into the gate electrode in PMOS devices., , , and . Microelectron. Reliab., 41 (7): 1085-1088 (2001)Monte Carlo simulation of silicon amorphization during ion implantation., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (12): 1236-1243 (1998)Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC., , , , , and . Microelectron. Reliab., 53 (12): 1841-1847 (2013)Quantitative oxide charge determination by photocurrent analysis., , and . Microelectron. Reliab., 47 (4-5): 673-677 (2007)Simulation of silicon semiconductor processing., and . Eur. Trans. Telecommun., 1 (3): 293-299 (1990)Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors., , , , , and . Microelectron. Reliab., 43 (8): 1253-1257 (2003)Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor., , , , , and . Microelectron. Reliab., 45 (5-6): 819-822 (2005)