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Sparse Space Shift Keying Modulation with Enhanced Constellation Mapping.

, , , and . Sensors, 22 (15): 5895 (2022)

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Diagnosis of clustered faults and wafer testing., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (2): 136-148 (1998)Diagnosability of system faults with propagation under asymmetric invalidation.. Microprocess. Microprogramming, 24 (1-5): 723-730 (1988)Design of OvTDM Toward Enhanced Physical Layer Security., , , and . ISNCC, page 1-4. IEEE, (2023)Sparse Space Shift Keying Modulation with Enhanced Constellation Mapping., , , and . Sensors, 22 (15): 5895 (2022)UAV-Aided Dual-User Wireless Power Transfer: 3D Trajectory Design and Energy Optimization., , and . Sensors, 23 (6): 2994 (March 2023)Application of knowledge graph in software engineering field: A systematic literature review., , , , and . Inf. Softw. Technol., (December 2023)A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing., , , and . IEEE Trans. Parallel Distributed Syst., 6 (4): 363-372 (1995)Wafer Testing with Pairwise Comparisons., , and . FTCS, page 374-383. IEEE Computer Society, (1992)Correct Diagnosis of Almost All Faulty Units in a Multiprocessor System., , , and . Journal of Circuits, Systems, and Computers, 8 (4): 473-481 (1998)Almost Sure Diagnosis of Almost Every Good Element., , and . IEEE Trans. Computers, 43 (3): 295-305 (1994)