Author of the publication

Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits.

, and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (11): 1200-1210 (1998)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Test Pattern Generation for Realistic Bridge Faults in CMOS ICs., and . ITC, page 492-499. IEEE Computer Society, (1991)A Study of Undetectable Non-Feedback Shorts for the Purpose of Physical-DFT., and . EDAC-ETC-EUROASIC, page 371-375. IEEE Computer Society, (1994)Charge-based fault simulation for CMOS network breaks., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (12): 1555-1567 (1996)Detection of Multiple Faults in Two-Dimensional ILAs., and . IEEE Trans. Computers, 45 (6): 741-746 (1996)The Design of Easily Tastabel VLSI Array Multipliers., and . IEEE Trans. Computers, 33 (6): 554-560 (1984)A CMOS fault extractor for inductive fault analysis., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 7 (11): 1181-1194 (1988)Test sequence generation for controller verification and test with high coverage., and . ACM Trans. Design Autom. Electr. Syst., 11 (4): 916-938 (2006)Testing Finite State Machines Based on a Structural Coverage Metric ., and . ITC, page 773-780. IEEE Computer Society, (2002)Incorporating Physical Design-for-Test into Routing., and . ITC, page 685-693. IEEE Computer Society, (1997)Defect Classes - An Overdue Paradigm for CMOS IC., , , and . ITC, page 413-425. IEEE Computer Society, (1994)