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Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits.

, and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (11): 1200-1210 (1998)

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A Linear Program Driven Scheduling and Allocation Method Followed by an Interconnect Optimization Algorithm., and . DAC, page 77-83. IEEE Computer Society Press, (1990)Charge-based fault simulation for CMOS network breaks., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (12): 1555-1567 (1996)Fault simulation of interconnect opens in digital CMOS circuits.. ICCAD, page 548-554. IEEE Computer Society / ACM, (1997)Validation and Test of Network Processors and ASICs., , , , and . VTS, page 407-410. IEEE Computer Society, (2002)DFFT : Design For Functional Testability., and . ITC, page 1105-1114. IEEE Computer Society, (2003)DFT and Test Problems from the Trenches.. VTS, page 120. IEEE Computer Society, (2009)Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 17 (11): 1200-1210 (1998)Voltage- and current-based fault simulation for interconnect open defects.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (12): 1768-1779 (1999)Explorations of sequential ATPG using Boolean satisfiability., and . VTS, page 85-90. IEEE Computer Society, (1993)Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits., and . ITC, page 597-606. IEEE Computer Society, (1997)