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Disambiguation of "Schvittz, Rafael B."

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Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults.

, , , and . ICECS, page 357-360. IEEE, (2018)

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Rafael Plonka

Impact of the interface on the paraelectric-to-ferroelectric phase transition in epitaxial BaSrTiO_tn3 thin film capacitors. TU Aachen, (2007)

Rafael Weber

Rafael Bielmeier

Rafael Valdueza

Rafael Capurro

 

Other publications of authors with the same name

Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults., , , and . ICECS, page 357-360. IEEE, (2018)The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis., , , , and . ISCAS, page 1610-1614. IEEE, (2022)Fault masking ratio analysis of majority voters topologies., , and . LATS, page 1-6. IEEE, (2018)Exploring Logic Gates Layout to Improve the Accuracy of Circuit Reliability Estimation., , and . VLSI-SoC, page 234-235. IEEE, (2019)Fault Tolerance Evaluation of Different Majority Voter Designs., , , , , and . ISCAS, page 185-189. IEEE, (2022)An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults., , , and . VLSI-SoC (Selected Papers), volume 586 of IFIP Advances in Information and Communication Technology, page 69-88. Springer, (2019)Reliability evaluation of circuits designed in multi- and single-stage versions., , , , , , and . LASCAS, page 1-4. IEEE, (2018)Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems., , , , , , , , , and 2 other author(s). J. Electron. Test., 39 (4): 409-420 (August 2023)Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing., , , , and . SBCCI, page 1-6. IEEE, (2022)The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits., , , , and . ICECS, page 433-436. IEEE, (2018)