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Disambiguation of "Cacho, Florian"

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Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.

, , , , and . ERMAVSS@DATE, volume 1566 of CEUR Workshop Proceedings, page 38-40. CEUR-WS.org, (2016)

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Milan Cachovan

Milan Cachovan

Milan Cachovan

Georg Cachovan

Milan Cachovan

 

Other publications of authors with the same name

Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes., , , , and . Microelectron. Reliab., (2016)In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability., , , , and . IVSW, page 1-5. IEEE, (2016)Global and Local Process Variation Simulations in Design for Reliability approach., , , and . IOLTS, page 72-75. IEEE, (2019)Workload dependent reliability timing analysis flow., , , , , , and . DATE, page 736-737. IEEE, (2017)Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI., , , , , , , and . DATE, page 441-446. ACM, (2015)Monitoring Setup and Hold Timing Limits., , and . IRPS, page 1-6. IEEE, (2021)New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes., , , and . IRPS, page 11. IEEE, (2022)Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes., , , , , , , , and . IOLTS, page 43-46. IEEE, (2016)Study of workload impact on BTI HCI induced aging of digital circuits., , , , and . DATE, page 1020-1021. IEEE, (2016)Cognitive approach to support dynamic aging compensation., , , , , , , , and . ITC, page 1-7. IEEE, (2017)