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Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.

, , , , and . ERMAVSS@DATE, volume 1566 of CEUR Workshop Proceedings, page 38-40. CEUR-WS.org, (2016)

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New Perspectives on Core In-field Path Delay Test., , , , , and . ITC, page 1-5. IEEE, (2020)Study of workload impact on BTI HCI induced aging of digital circuits., , , , and . DATE, page 1020-1021. IEEE, (2016)Configurable serial fault-tolerant link for communication in 3D integrated systems., , , and . IOLTS, page 115-120. IEEE Computer Society, (2010)Flexi-AES: A Highly-Parameterizable Cipher for a Wide Range of Design Constraints., , , , and . FCCM, page 338. IEEE, (2019)Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI., , , , , , , and . DATE, page 441-446. ACM, (2015)Multi-context non-volatile content addressable memory using magnetic tunnel junctions., , , and . NANOARCH, page 103-108. ACM, (2016)In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability., , , , and . IVSW, page 1-5. IEEE, (2016)Hidden-Delay-Fault Sensor for Test, Reliability and Security., , , and . DATE, page 316-319. IEEE, (2019)Workload dependent reliability timing analysis flow., , , , , , and . DATE, page 736-737. IEEE, (2017)Monitoring Setup and Hold Timing Limits., , and . IRPS, page 1-6. IEEE, (2021)