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Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.

A. Sivadasan, F. Cacho, S. Benhassain, V. Huard, и L. Anghel. ERMAVSS@DATE, том 1566 из CEUR Workshop Proceedings, стр. 38-40. CEUR-WS.org, (2016)

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Eveline-Johanna Huard

Vincent Herrmann

Vincent Fochtman

Vincent Feyen

Vincent Wroblewsky

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