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Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)Operators allocation in the silicon compiler SCOOP., , and . Integr., 8 (2): 99-109 (1989)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Alleviating DFT Cost Using Testability Driven HLS., , and . Asian Test Symposium, page 46-51. IEEE Computer Society, (1998)A Heuristic for Test Scheduling at System Level., , and . DATE, page 1124. IEEE Computer Society, (2002)Scan Design and Secure Chip., , , , , and . IOLTS, page 219-226. IEEE Computer Society, (2004)