( en | de | ru )

 

Disambiguation of "Iwai, Hiroshi"

Author of the publication

copydeleteadd this publication to your clipboard
La2O3 gate dielectrics for AlGaN/GaN HEMT.

, , , , , , , and . Microelectron. Reliab., (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Heinz Iwainsky

Tohru Iwai

Masayasu Iwai

Hiroshi Kawabe

Hiroshi Murata

 

Other publications of authors with the same name

CMOS technology-year 2010 and beyond.. IEEE J. Solid State Circuits, 34 (3): 357-366 (1999)Foundries, EDA vendors, and designers: who shoulders the blame when a design doesn't work in the nano-scale and wireless era?, , , , , , , , , and 1 other author(s). CICC, page 618-619. IEEE, (2005)Improvement of SiO2/4H-SiC Interface properties by post-metallization annealing., , , , , , , and . Microelectron. Reliab., (2018)Trend of CMOS downsizing and its reliability., and . Microelectron. Reliab., 42 (9-11): 1251-1258 (2002)Si nanowire FET and its modeling., , , , , , , , and . Sci. China Inf. Sci., 54 (5): 1004-1011 (2011)3-D Angular Spectrum Measurements at 5 GHz in a Residential Two-Story House., , , and . IEICE Trans. Commun., 90-B (9): 2344-2351 (2007)Equivalent Noise Temperature Representation for Scaled MOSFETs., , and . IEICE Trans. Electron., 93-C (10): 1550-1552 (2010)Improvement on sheet resistance uniformity of nickel silicide by optimization of silicidation conditions., , , , , , , , and . Microelectron. Reliab., 53 (5): 665-669 (2013)Resistive switching properties of a thin SiO2 layer with CeOx buffer layer on n+ and p+ Si bottom electrodes., , , , , and . Microelectron. Reliab., (2016)Silicon integrated circuit technology from past to future., and . Microelectron. Reliab., 42 (4-5): 465-491 (2002)