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Disambiguation of "Ciappa, Mauro"

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Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation.

, , , , and . Microelectron. Reliab., 49 (9-11): 972-976 (2009)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mauro Ciappa

Christian Mauro

Frank Mauroschat

Jacopo Mauro

Carola Mauroschat-Galla

 

Other publications of authors with the same name

A Multilevel CMOS&\#x02013;MEMS Design Methodology Based on Response Surface Models, , , , , , and . Journal of Microelectromechanical Systems, (2011)Characterization of photonic devices by secondary electron potential contrast., , and . Microelectron. Reliab., 46 (9-11): 1536-1541 (2006)Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles., , , , and . Microelectron. Reliab., 45 (9-11): 1694-1699 (2005)Reliability odometer for real-time and in situ lifetime measurement of power devices., and . Microelectron. Reliab., 55 (9-10): 1351-1356 (2015)A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters., , , , and . Microelectron. Reliab., 50 (9-11): 1750-1757 (2010)On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques., , , , and . Microelectron. Reliab., 44 (9-11): 1703-1708 (2004)On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices., , , , and . Microelectron. Reliab., 43 (9-11): 1771-1776 (2003)Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources., and . IRPS, page 1-7. IEEE, (2020)Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation., and . IRPS, page 1-8. IEEE, (2021)Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources., , and . Microelectron. Reliab., (2018)