Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis.

D. Dumas, P. Girard, C. Landrault, and S. Pravossoudovitch. EDAC-ETC-EUROASIC, page 518-523. IEEE Computer Society, (1994)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

A Ring Architecture Strategy for BIST Test Pattern Generation.C. Fagot, O. Gascuel, P. Girard, and C. Landrault. J. Electron. Test., 19 (3): 223-231 (2003)Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata.A. Yan, R. Liu, J. Cui, T. Ni, P. Girard, X. Wen, and J. Zhang. IEEE Trans. Circuits Syst. II Express Briefs, 70 (6): 2256-2260 (June 2023)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*.A. Bosio, I. O'Connor, M. Traiola, J. Echavarria, J. Teich, M. Hanif, M. Shafique, S. Hamdioui, B. Deveautour, P. Girard and 2 other author(s). ETS, page 1-10. IEEE, (2021)Fast Bridging Fault Diagnosis using Logic Information.A. Rousset, A. Bosio, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. ATS, page 33-38. IEEE, (2007)Power-Aware Test Data Compression for Embedded IP Cores.N. Badereddine, Z. Wang, P. Girard, K. Chakrabarty, S. Pravossoudovitch, and C. Landrault. ATS, page 5-10. IEEE, (2006)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments.A. Yan, Z. Li, J. Cui, Z. Huang, T. Ni, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 59 (3): 2885-2897 (June 2023)Towards a Model-Based Approach to Support Physical Test Process of Aircraft Hydraulic Systems.O. Mesli-Kesraoui, Y. Ouhammou, O. Goubali, P. Berruet, P. Girard, and E. Grolleau. MEDI, volume 12732 of Lecture Notes in Computer Science, page 33-40. Springer, (2021)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)

BibSonomy

Disambiguation of "Girard, Patrick"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis.