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Disambiguation of "Gupta, Sandeep K."

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Analyzing Crosstalk in the Presence of Weak Bridge Defects.

, , , , and . VTS, page 385-392. IEEE Computer Society, (2003)

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Sandeep Gupta

Varun K Gupta

Sandeep Sadanandan

Sandeep Kumar

Sandeep Nambiar

 

Other publications of authors with the same name

ATPG for Heat Dissipation Minimization During Test Application., and . IEEE Trans. Computers, 47 (2): 256-262 (1998)Threshold Testing: Improving Yield for Nanoscale VLSI., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (12): 1883-1895 (2009)Test embedding with discrete logarithms., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (5): 554-566 (1995)BIST TPG for Combinational Cluster Interconnect Testing at Board Level., and . J. Electron. Test., 16 (5): 427-442 (2000)Introducing redundant computations in RTL data paths for reducing BIST resources., , and . ACM Trans. Design Autom. Electr. Syst., 6 (3): 423-445 (2001)Intention-to-treat concept: A review.. Perspectives in clinical research, 2 (3): 109-12 (July 2011)LR: 20130529; JID: 101551517; OID: NLM: PMC3159210; OTO: NOTNLM; ppublish;<m:linebreak></m:linebreak>Intention to treat.Tolerance of performance degrading faults for effective yield improvement., , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models., , and . ITC, page 1024-1033. IEEE Computer Society, (2004)An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes., and . ITC, page 824-833. IEEE Computer Society, (2002)Can Concurrent Checkers Help BIST?, and . ITC, page 140-150. IEEE Computer Society, (1992)