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Disambiguation of "Lee, N.-H."

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Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC.

, , , , , , , , and . IRPS, page 1-4. IEEE, (2023)

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-N Lee

n n n

Matthias H N Mehdorn

Hiêp H Ì n

Jürgen H N Brämswig

 

Other publications of authors with the same name

Reliability Improvement with Optimized BEOL Process in Advanced DRAM., , , , , , , and . IRPS, page 1-4. IEEE, (2023)Fluid and Brownian approximations for an Internet congestion control model., , , and . CDC, page 3938-3943. IEEE, (2004)Technology development for the radiation hardening of robots., , , , and . IROS, page 1715-1720. IEEE, (1999)Product form stationary distributions for diffusion approximations to a flow-level model operating under a proportional fair sharing policy., , , and . SIGMETRICS Perform. Evaluation Rev., 35 (2): 36-38 (2007)Discovery of conjoined charge density waves in the kagome superconductor CsV$_3$Sb$_5$, , , , , , , , , and 11 other author(s). Nat Commun, 13 (6348): 6348 (Oct 26, 2022)https://arxiv.org/abs/2202.13530.Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs., , , , , , , and . Microelectron. Reliab., 52 (9-10): 1905-1908 (2012)Reliability Characterization of HBM featuring $HK+MG$ Logic Chip with Multi-stacked DRAMs., , , , , , , , and . IRPS, page 1-7. IEEE, (2023)Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC., , , , , , , , and . IRPS, page 1-4. IEEE, (2023)