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An Effective and Sensitive Scan Segmentation Technique for Detecting Hardware Trojan.

, , and . IEICE Trans. Inf. Syst., 100-D (1): 130-139 (2017)

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An ECC-based memory architecture with online self-repair capabilities for reliability enhancement., , , , and . ETS, page 1-6. IEEE, (2015)Aging test strategy and adaptive test scheduling for SoC failure prediction., , , , , and . IOLTS, page 21-26. IEEE Computer Society, (2010)Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses., , , and . ASP-DAC, page 720-725. IEEE Computer Society, (2007)Wrapper and TAM Co-Optimization for Reuse of SoC Functional Interconnects., and . DATE, page 1366-1369. ACM, (2008)DART: Dependable VLSI test architecture and its implementation., , , , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2012)A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation., , , and . ITC, page 1-8. IEEE Computer Society, (2012)Power-Aware Multi-Frequency Heterogeneous SoC Test Framework Design with Floor-Ceiling Packing., , , and . ISCAS, page 2942-2945. IEEE, (2007)A DFT Method for Time Expansion Model at Register Transfer Level., , and . DAC, page 682-687. IEEE, (2007)An integrated DFT solution for power reduction in scan test applications by low power gating scan cell., , , , and . Integr., (2017)Test Scheduling for Memory Cores with Built-In Self-Repair., , and . ATS, page 199-206. IEEE, (2007)