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Deformations of IC Structure in Test and Yield Learning.

, , , , , и . ITC, стр. 856-865. IEEE Computer Society, (2003)

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Kier Storey

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Thomas M Schmid

 

Другие публикации лиц с тем же именем

Stuck Fault and Current Testing Comparison Using CMOS Chip Test., , , и . ITC, стр. 311-318. IEEE Computer Society, (1991)CMOS Bridging Fault Detection., и . ITC, стр. 1123-1132. IEEE Computer Society, (1990)A Test Methodology to Support an ASEM MCM Foundry., , , и . ITC, стр. 426-435. IEEE Computer Society, (1994)A Test Methodology for VLSI Chips on Silicon.. ITC, стр. 359-368. IEEE Computer Society, (1993)Testing in a high volume DSM Environment.. ITC, стр. 1422. IEEE Computer Society, (2004)A Test Methodology for High Performance MCMs., и . J. Electron. Test., 10 (1-2): 109-118 (1997)Delay test simulation., и . DAC, стр. 492-494. ACM, (1977)Deformations of IC Structure in Test and Yield Learning., , , , , и . ITC, стр. 856-865. IEEE Computer Society, (2003)