Author of the publication

An Oscillation-Based On-Chip Temperature-Aware Dynamic Voltage and Frequency Scaling Scheme in System-on-a-Chip.

, , , and . IEICE Trans. Inf. Syst., 97-D (9): 2320-2329 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect Test., and . IEEE Trans. Very Large Scale Integr. Syst., 21 (7): 1333-1337 (2013)Fault tolerant application-specific NoC topology synthesis for three-dimensional integrated circuits., , , , , and . SoCC, page 296-301. IEEE, (2011)Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction Under Output Constraint.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (4): 618-626 (2010)IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection., , , and . J. Electron. Test., 23 (4): 341-355 (2007)Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture., , , and . ATS, page 95-100. IEEE, (2007)IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults., , , , and . ASP-DAC, page 366-371. IEEE, (2006)Oscillation ring based interconnect test scheme for SOC., , , and . ASP-DAC, page 184-187. ACM Press, (2005)De Bruijn graph-based communication modeling for fault tolerance in smart grids., , and . APCCAS, page 623-626. IEEE, (2012)Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator., , and . Asian Test Symposium, page 91-96. IEEE Computer Society, (2013)Test generation for combinational hardware Trojans., , , and . AsianHOST, page 1-6. IEEE Computer Society, (2016)