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Disambiguation of "Nakashima, Hidenari"

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An Approach for Reducing Leakage Current Variation due to Manufacturing Variability.

, , , , , , , , , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 92-A (12): 3016-3023 (2009)

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Other publications of authors with the same name

Circuit Performance Prediction Considering Core Utilization with Interconnect Length Distribution Model., , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 88-A (12): 3358-3366 (2005)Proposal of Metrics for SSTA Accuracy Evaluation., , , , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (4): 808-814 (2007)Fast Methods to Estimate Clock Jitter due to Power Supply Noise., , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (4): 741-747 (2007)Wire Length Distribution Model Considering Core Utilization for System on Chip., , , , , and . ISVLSI, page 276-277. IEEE Computer Society, (2005)Impact of Self-Heating in Wire Interconnection on Timing., , , , , , , , , and 2 other author(s). IEICE Trans. Electron., 93-C (3): 388-392 (2010)Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations., , , , , , , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 92-A (4): 990-997 (2009)Wire Length Distribution Model for System LSI., , , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 88-A (12): 3445-3452 (2005)Evaluation of X Architecture Using Interconnect Length Distribution., , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 88-A (12): 3437-3444 (2005)ULSI Interconnect Length Distribution Model Considering Core Utilization., , , and . DATE, page 1210-1217. IEEE Computer Society, (2004)An Approach for Reducing Leakage Current Variation due to Manufacturing Variability., , , , , , , , , and 2 other author(s). IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 92-A (12): 3016-3023 (2009)