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The role of test protocols in testing embedded-core-based system ICs.

, и . ETW, стр. 70-75. IEEE Computer Society, (1999)

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Maurice Hollmann

Wissensrepräsentation zur integrierten Steuerung von Experimenten in der Echtzeit-fMRT: neuroökonomische Untersuchung sozialer Interaktion. Uni Magdeburg, (2009)

Maurice Kersten

Maurice Bonten

Maurice Arcq

Maurice Horcajo

 

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A New Algorithm for Dynamic Faults Detection in RAMs., , , и . VTS, стр. 177-182. IEEE Computer Society, (2005)IEEE Std 1500 Compliant Infrastructure forModular SOC Testing., , и . Asian Test Symposium, стр. 450. IEEE Computer Society, (2005)The role of test protocols in testing embedded-core-based system ICs., и . ETW, стр. 70-75. IEEE Computer Society, (1999)An Effective Diagnosis Method to Support Yield Improvement., , , и . ITC, стр. 260-269. IEEE Computer Society, (2002)Memory testing improvements through different stress conditions., , , , , и . ESSCIRC, стр. 299-302. IEEE, (2005)Static component interconnect test technology (SCITT) a new technology for assembly testing., , , и . ITC, стр. 439-448. IEEE Computer Society, (1999)Wrapper design for embedded core test., , , и . ITC, стр. 911-920. IEEE Computer Society, (2000)CTL the language for describing core-based test., , , , , и . ITC, стр. 131-139. IEEE Computer Society, (2001)IP and Automation to Support IEEE P1500., , , , , и . VTS, стр. 411-412. IEEE Computer Society, (2001)Diagnosis of Full Open Defects in Interconnecting Lines., , , , , , , и . VTS, стр. 158-166. IEEE Computer Society, (2007)