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Disambiguation of "Trémouilles, David"

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Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD).

, , , , , , and . Microelectron. Reliab., 49 (9-11): 1103-1106 (2009)

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Erich David

Ernst David

Baruch Davidoff

Frida David

Walter David

 

Other publications of authors with the same name

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation., , , , and . Microelectron. Reliab., 53 (2): 221-228 (2013)RF ESD protection strategies - the design and performance trade-off challenges., , , , , , , , , and 5 other author(s). CICC, page 489-496. IEEE, (2005)Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation., , , , , , and . Microelectron. Reliab., 41 (9-10): 1539-1544 (2001)New triggering-speed-characterization method for diode-triggered SCR using TLP., , , , , and . Microelectron. Reliab., (2017)Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency., , , , , and . IEEE J. Solid State Circuits, 39 (10): 1778-1782 (2004)A plug-and-play wideband RF circuit ESD protection methodology: T-diodes., , , , , , , , , and . Microelectron. Reliab., 49 (12): 1440-1446 (2009)Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications., , , , , , , , and . Microelectron. Reliab., 44 (9-11): 1781-1786 (2004)Accelerated lifetime test of RF-MEMS switches under ESD stress., , , , , , , , and . Microelectron. Reliab., 49 (9-11): 1256-1259 (2009)Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure., , , , , , , , and . Microelectron. Reliab., 45 (9-11): 1415-1420 (2005)Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology., , , , , , , , and . IEEE J. Solid State Circuits, 36 (9): 1373-1381 (2001)