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On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs.

S. Wu, L. Wang, Z. Jiang, J. Song, B. Sheu, X. Wen, M. Hsiao, J. Li, J. Huang, и R. Apte. DFT, стр. 143-151. IEEE Computer Society, (2008)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

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Towards the next generation of low-power test technologies.X. Wen. ASICON, стр. 232-235. IEEE, (2011)Fault Diagnosis of Physical Defects Using Unknown Behavior Model.X. Wen, H. Tamamoto, K. Saluja, и K. Kinoshita. J. Comput. Sci. Technol., 20 (2): 187-194 (2005)A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.Z. Song, A. Yan, J. Cui, Z. Chen, X. Li, X. Wen, C. Lai, Z. Huang, и H. Liang. ITC-Asia, стр. 139-144. IEEE, (2019)Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications.A. Yan, Z. Wu, L. Lu, Z. Chen, J. Song, Z. Ying, P. Girard, и X. Wen. ATS, стр. 43-48. IEEE, (2019)Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test.S. Holst, S. Shi, и X. Wen. PRDC, стр. 124-129. IEEE, (2019)Test Pattern Modification for Average IR-Drop Reduction.W. Ding, H. Hsieh, C. Han, J. Li, и X. Wen. IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 38-49 (2016)Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding.D. Xiang, X. Wen, и L. Wang. IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 942-953 (2017)VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.L. Wang, X. Wen, S. Wu, Z. Wang, Z. Jiang, B. Sheu, и X. Gu. IEEE Des. Test Comput., 25 (2): 122-130 (2008)High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.K. Miyase, X. Wen, H. Furukawa, Y. Yamato, S. Kajihara, P. Girard, L. Wang, и M. Tehranipoor. IEICE Trans. Inf. Syst., 93-D (1): 2-9 (2010)A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing.Y. Yamato, X. Wen, K. Miyase, H. Furukawa, и S. Kajihara. IEICE Trans. Inf. Syst., 94-D (4): 833-840 (2011)

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