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Disambiguation of "Malbert, Nathalie"

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Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates.

, , , , , , and . Microelectron. Reliab., 43 (9-11): 1713-1718 (2003)

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Nathalie Mispagel

Nathalie Schmitz

Nathalie Gusew

Nathalie Véron

Nathalie Domanoldou

 

Other publications of authors with the same name

Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors., , , and . Microelectron. Reliab., 44 (9-11): 1361-1368 (2004)Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses., , , , , , , and . Microelectron. Reliab., 41 (9-10): 1573-1578 (2001)Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test., , , , , , , , , and 1 other author(s). Microelectron. Reliab., 52 (9-10): 2184-2187 (2012)Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC., , , , , , , and . Microelectron. Reliab., 47 (9-11): 1630-1633 (2007)Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques., , , , , , , and . Microelectron. Reliab., 48 (8-9): 1366-1369 (2008)Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs., , , , , , , , , and 3 other author(s). Microelectron. Reliab., 49 (9-11): 1216-1221 (2009)Influence of gate leakage current on AlGaN/GaN HEMTs evidenced by low frequency noise and pulsed electrical measurements., , , , , , , , , and 4 other author(s). Microelectron. Reliab., 53 (9-11): 1491-1495 (2013)Degradation mechanisms induced by thermal and bias stresses in InP HEMTs., , , , , and . Microelectron. Reliab., 42 (9-11): 1575-1580 (2002)Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors., , , , and . IRPS, page 4. IEEE, (2018)AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements., , , , , and . Microelectron. Reliab., 46 (9-11): 1725-1730 (2006)