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Другие публикации лиц с тем же именем

Software-Based Self-Test for Transition Faults: a Case Study., , , и . VLSI-SoC, стр. 76-81. IEEE, (2019)Test-Plan Optimization for Flying-Probes In-Circuit Testers., , , и . ITC-Asia, стр. 19-24. IEEE, (2019)System-level test bench generation in a co-design framework., , , , и . ETW, стр. 25-30. IEEE Computer Society, (2000)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , и . DATE, стр. 115-120. IEEE, (2017)Exploring the Mysteries of System-Level Test., , , , , , , , , и . ATS, стр. 1-6. IEEE, (2020)Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor., , , , , и . ATS, стр. 73-78. IEEE, (2021)Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing., , , , , и . ETS, стр. 1-5. IEEE, (2023)Exploiting the Selfish Gene algorithm for evolving hardware cellular automata., , и . CEC, стр. 1401-1406. IEEE, (2000)Simulation-Based Analysis of SEU Effects on SRAM-based FPGAs., , и . FPL, том 2438 из Lecture Notes in Computer Science, стр. 607-615. Springer, (2002)A Software Fault Tolerance Method for Safety-Critical Systems: Effectiveness and Drawbacks., , , , и . SBCCI, стр. 101-108. IEEE Computer Society, (2002)