( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Chip-Level Substrate Coupling Analysis with Reference Structures for Verification.

, , , и . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (12): 2651-2660 (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Yoshitaka Toyama

Yoshitaka Nakamura

 

Другие публикации лиц с тем же именем

Differential equivalent time sampling receiver for breast cancer detection., , , , , , , и . BioCAS, стр. 1-4. IEEE, (2017)Chip-Level Substrate Noise Analysis with Network Reduction by Fundamental Matrix Computation., , , , и . ISQED, стр. 482-487. IEEE Computer Society, (2001)Background Calibration Techniques for Low-Power and High-Speed Data Conversion., , , и . IEICE Trans. Electron., 94-C (6): 923-929 (2011)Substrate Noise Analysis with Compact Digital Noise Injection and Substrate Models., , , , и . ASP-DAC/VLSI Design, стр. 71-76. IEEE Computer Society, (2002)Investigation of phase noise and jitter in CMOS sampling clock generation circuits for time-domain breast cancer detection system., , , , , , , и . BioCAS, стр. 1-4. IEEE, (2017)Evaluation of Isolation Structures against High-Frequency Substrate Coupling in Analog/Mixed-Signal Integrated Circuits., , , и . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (2): 380-387 (2007)CMOS Gaussian Monocycle Pulse Transceiver for Radar-Based Microwave Imaging., , , , , , , , , и 6 other автор(ы). IEEE Trans. Biomed. Circuits Syst., 14 (6): 1333-1345 (2020)Chip-Level Substrate Coupling Analysis with Reference Structures for Verification., , , и . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (12): 2651-2660 (2007)Shifting Clock Jitter and Phase Interval for Impulse-Radar-Based Breast Cancer Detection., , , , , , , , , и . BioCAS, стр. 1-4. IEEE, (2019)Chip-Level Substrate Noise Analysis with Emphasis of Vertical Impurity Profile for Isolation., , , и . CICC, стр. 849-852. IEEE, (2007)