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Disambiguation of "Kang, Sungho"

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Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost.

, , , and . IEEE Trans. Computers, 67 (12): 1835-1839 (2018)

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Sungho Jo

Mihyun Kang

Ewha Kang

Kang Teng

Andree Kang

 

Other publications of authors with the same name

A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability., , and . IEEE Trans. Reliab., 64 (1): 486-496 (2015)Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (4): 803-812 (2014)A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (11): 2380-2387 (2014)A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals., , , and . IEICE Trans. Electron., 91-C (10): 1713-1716 (2008)An Effective Built-In Self-Test for Chargepump PLL., , , , and . IEICE Trans. Electron., 88-C (8): 1731-1733 (2005)A New Analog-to-Digital Converter BIST Considering a Transient Zone., , , , and . IEICE Trans. Electron., 90-C (11): 2161-2163 (2007)An Effective Programmable Memory BIST for Embedded Memory., , , and . IEICE Trans. Inf. Syst., 92-D (12): 2508-2511 (2009)An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector., , and . IEICE Trans. Commun., 94-B (11): 3128-3131 (2011)Built-In Self-Test for Static ADC Testing with a Triangle-Wave., , and . IEICE Trans. Electron., 96-C (2): 292-294 (2013)Test data reduction method based on berlekamp-massey algorithm., , , and . ISOCC, page 123-124. IEEE, (2017)