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RF circuit design aspects of spiral inductors on silicon., , , , and . IEEE J. Solid State Circuits, 33 (12): 2028-2034 (1998)An 11 GHz 3-V SiGe voltage controlled oscillator with integrated resonator., , , , , , , and . IEEE J. Solid State Circuits, 32 (9): 1451-1454 (1997)Measurement and modeling of on-chip transmission line effects in a 400 MHz microprocessor., , , and . IEEE J. Solid State Circuits, 33 (4): 662-665 (1998)Integrated RF components in a SiGe bipolar technology., , , , , , , and . IEEE J. Solid State Circuits, 32 (9): 1440-1445 (1997)Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection., , , , , , , , , and 10 other author(s). IBM J. Res. Dev., 49 (4-5): 725-754 (2005)A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology., , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (7): 1360-1364 (2015)Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops., and . IEEE Des. Test Comput., 17 (2): 86-93 (2000)Effect of HCI degradation on the variability of MOSFETS., , , and . IRPS, page 1. IEEE, (2018)Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology., , , and . IRPS, page 6. IEEE, (2015)Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators., , , and . ESSCIRC, page 419-422. IEEE, (2013)