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A Mesh Morphing Technique For Geometrically Dissimilar Tessellated Surfaces., , , and . IMR, page 315-334. Springer, (2007)X-Press Compactor for 1000x Reduction of Test Data., , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)Highly X-Tolerant Selective Compaction of Test Responses., , , , and . VTS, page 245-250. IEEE Computer Society, (2009)Parameterizable Testing Scheme for FIR Filters., , and . ITC, page 694-703. IEEE Computer Society, (1997)On Test Points Enhancing Hardware Security., , , , and . ATS, page 61-66. IEEE Computer Society, (2016)Improving Test Quality Using Test Data Compression.. Asian Test Symposium, page 463. IEEE Computer Society, (2005)Power Aware Embedded Test., , , , , and . Asian Test Symposium, page 511-516. IEEE Computer Society, (2011)Cost of Test - Taking Control.. ITC, page 1431. IEEE Computer Society, (2004)Full-speed field-programmable memory BIST architecture., , , and . ITC, page 9. IEEE Computer Society, (2005)Defect Aware to Power Conscious Tests - The New DFT Landscape., , and . VLSI Design, page 23-25. IEEE Computer Society, (2009)