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A DMA and CACHE-based stress schema for burn-in of automotive microcontroller., , , , , , и . LATS, стр. 1-6. IEEE, (2017)Reliability and Testing of Complex Safety-Critical Automotive SoC.. Polytechnic University of Turin, Italy, (2020)A Hybrid In-Field Self-Test Technique for SoCs., , и . DTIS, стр. 1-6. IEEE, (2019)Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC., , , , , , и . J. Electron. Test., 34 (1): 43-52 (2018)Applicative System Level Test introduction to Increase Confidence on Screening Quality., , , , , и . DDECS, стр. 1-6. IEEE, (2020)Innovative Practices on Automotive Test., , и . VTS, стр. 1. IEEE, (2019)Scan chain encryption for the test, diagnosis and debug of secure circuits., , , , , и . ETS, стр. 1-6. IEEE, (2017)Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test., , , , , , , , , и . DDECS, стр. 1-6. IEEE, (2019)On-line software-based self-test for ECC of embedded RAM memories., , , и . DFT, стр. 1-6. IEEE Computer Society, (2017)An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In., , , , , , , , , и 1 other автор(ы). J. Low Power Electron., 14 (1): 86-98 (2018)