%0 Conference Paper %1 conf/irps/WuMJHBSGDR15 %A Wu, Tian-Li %A Marcon, Denis %A Jaeger, Brice De %A Hove, Marleen Van %A Bakeroot, Benoit %A Stoffels, Steve %A Groeseneken, Guido %A Decoutere, Stefaan %A Roelofs, Robin %B IRPS %D 2015 %I IEEE %K dblp %P 6 %T Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#WuMJHBSGDR15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/WuMJHBSGDR15, added-at = {2024-05-07T00:00:00.000+0200}, author = {Wu, Tian-Li and Marcon, Denis and Jaeger, Brice De and Hove, Marleen Van and Bakeroot, Benoit and Stoffels, Steve and Groeseneken, Guido and Decoutere, Stefaan and Roelofs, Robin}, biburl = {https://www.bibsonomy.org/bibtex/2f4aa0eda9b9ef188e24aaad19fb6e32d/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112769}, interhash = {3874b87910c832ec9ecf23776ceb602a}, intrahash = {f4aa0eda9b9ef188e24aaad19fb6e32d}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 6, publisher = {IEEE}, timestamp = {2024-05-13T09:40:57.000+0200}, title = {Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#WuMJHBSGDR15}, year = 2015 }