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Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs.

T. Wu, D. Marcon, B. Jaeger, M. Hove, B. Bakeroot, S. Stoffels, G. Groeseneken, S. Decoutere, and R. Roelofs. IRPS, page 6. IEEE, (2015)

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Xiao-Li Tian

Li-Chi Wu

Tian Tian

Xiaoyong Tian

Weiwei Tian

Other publications of authors with the same name

Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs.T. Wu, D. Marcon, B. Jaeger, M. Hove, B. Bakeroot, S. Stoffels, G. Groeseneken, S. Decoutere, and R. Roelofs. IRPS, page 6. IEEE, (2015)A Compact Planar Quasi-Yagi Antenna With Bandpass Filtering Response.G. Liu, Y. Pan, T. Wu, and P. Hu. IEEE Access, (2019)Design of a Low Profile and Compact Omnidirectional Filtering Patch Antenna.T. Wu, Y. Pan, P. Hu, and S. Zheng. IEEE Access, (2017)H-Bridge Derived Topology for Dynamic On-Resistance Evaluation in Power GaN HEMTs.R. Kumar, A. Sarkar, S. Anand, A. Verma, and T. Wu. IEEE Trans. Ind. Electron., 70 (2): 1532-1541 (2023)Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate.G. Meneghesso, M. Meneghini, D. Bisi, I. Rossetto, T. Wu, M. Hove, D. Marcon, S. Stoffels, S. Decoutere, and E. Zanoni. Microelectron. Reliab., (2016)Demonstration of Patterned GaN RF MIS-HEMTs Growing on Hybrid Oriented Silicon-on-Insulator (SOI) Substrates.B. Wang, C. Su, and T. Wu. DRC, page 1-2. IEEE, (2022)Wideband Omnidirectional Slotted Patch Antenna With Filtering Response.T. Wu, Y. Pan, and P. Hu. IEEE Access, (2017)Investigation of degradation phenomena in GaN-on-Si power MIS-HEMTs under source current and drain bias stresses.C. Yang, T. Wu, T. Hsieh, and E. Chang. IRPS, page 5-1. IEEE, (2018)Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis.I. Rossetto, M. Meneghini, V. Rizzato, M. Ruzzarin, A. Favaron, S. Stoffels, M. Hove, N. Posthuma, T. Wu, D. Marcon and 3 other author(s). Microelectron. Reliab., (2016)Device optimization for 200V GaN-on-SOI Platform for Monolithicly Integrated Power Circuits.O. Syshchyk, T. Cosnier, Z. Huang, D. Cingu, D. Wellekens, A. Vohra, K. Geens, P. Vudumula, U. Chatterjee, S. Decoutere and 2 other author(s). ESSDERC, page 245-248. IEEE, (2022)

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Xiao-Li Tian

Li-Chi Wu

Tian Tian

Xiaoyong Tian

Weiwei Tian

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Disambiguation of "Wu, Tian-Li"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs.

Please choose a person to relate this publication to

Xiao-Li Tian

Li-Chi Wu

Tian Tian

Xiaoyong Tian

Weiwei Tian

Other publications of authors with the same name

Disambiguation