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Disambiguation of "Vatajelu, Elena I."

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

, , , , , , , , , and . DFTS, page 143-148. IEEE Computer Society, (2013)

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Elena i ova

Elena I Rugarli

Claudia Ines Elena de Theissen

Adrien Elena

Claudia Ines Elena Theissen

 

Other publications of authors with the same name

Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric., , , and . Asian Test Symposium, page 413-418. IEEE Computer Society, (2011)Robustness analysis of 6T SRAMs in memory retention mode under PVT variations., and . DATE, page 980-985. IEEE, (2011)Nonvolatile memories: Present and future challenges., , and . IDT, page 61-66. IEEE, (2014)Rebooting Computing: The Challenges for Test and Reliability., , , , , , , , , and . DFT, page 8138-8143. IEEE, (2019)Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation., and . DATE, page 1343-1348. IEEE, (2012)Integration of STT-MRAM model into CACTI simulator., , , , , and . IDT, page 67-72. IEEE, (2014)Power-aware voltage tuning for STT-MRAM reliability., , , , , , and . ETS, page 1-6. IEEE, (2015)Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis., , , and . ETS, page 69-74. IEEE Computer Society, (2010)Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model., , , , , and . LATS, page 1-6. IEEE, (2019)Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures., , , , , , and . DTIS, page 39-44. IEEE, (2013)