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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

E. Vatajelu, G. Tsiligiannis, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, F. Wrobel, and F. Saigné. DFTS, page 143-148. IEEE Computer Society, (2013)

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Frédéric Leroux

Frédéric Ruckert

Frédéric Robin

Frédéric Roux

Frédéric Ziebarth

Other publications of authors with the same name

Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model.K. Guetarni, A. Touboul, J. Boch, L. Foro, A. Privat, A. Michez, J. Vaillé, and F. Saigné. Microelectron. Reliab., 53 (9-11): 1293-1299 (2013)Real-time SRAM based particle detector.L. Dilillo, A. Bosser, V. Gupta, F. Wrobel, and F. Saigné. IWASI, page 58-62. IEEE, (2015)Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning.G. Tsiligiannis, A. Touboul, G. Bricas, T. Maraine, J. Boch, F. Wrobel, A. Michez, F. Saigné, A. Godot, A. Etile and 4 other author(s). DTIS, page 1-6. IEEE, (2020)Effect of Temperature on Single Event Latchup Sensitivity.S. Guagliardo, F. Wrobel, Y. Aguiar, J. Autran, P. Leroux, F. Saigné, V. Pouget, and A. Touboul. DTIS, page 1-5. IEEE, (2020)MC-ORACLE: A tool for predicting Soft Error Rate.F. Wrobel, and F. Saigné. Comput. Phys. Commun., 182 (2): 317-321 (2011)SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.G. Tsiligiannis, E. Vatajelu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, F. Wrobel, and F. Saigné. IOLTS, page 145-150. IEEE, (2013)On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.E. Vatajelu, G. Tsiligiannis, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, F. Wrobel, and F. Saigné. DFTS, page 143-148. IEEE Computer Society, (2013)A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.G. Hubert, N. Buard, C. Weulersse, T. Carrière, M. Palau, J. Palau, D. Lambert, J. Baggio, F. Wrobel, F. Saigné and 1 other author(s). IOLTS, page 87-94. IEEE Computer Society, (2005)Evaluation of test algorithms stress effect on SRAMs under neutron radiation.G. Tsiligiannis, L. Dilillo, A. Bosio, P. Girard, A. Todri, A. Virazel, A. Touboul, F. Wrobel, and F. Saigné. IOLTS, page 121-122. IEEE Computer Society, (2012)Characterization of an SRAM based particle detector for mixed-field radiation environments.G. Tsiligiannis, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Todri-Sanial, A. Virazel, J. Mekki, M. Brugger, J. Vaillé and 2 other author(s). IWASI, page 75-80. IEEE, (2013)

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Disambiguation of "Saigné, Frédéric"

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Please choose a person to relate this publication to

Frédéric Leroux

Frédéric Ruckert

Frédéric Robin

Frédéric Roux

Frédéric Ziebarth

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Saigné, Frédéric"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Please choose a person to relate this publication to

Frédéric Leroux

Frédéric Ruckert

Frédéric Robin

Frédéric Roux

Frédéric Ziebarth

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.