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Disambiguation of "Wen, Shi-Jie"

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Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node.

, , , , , and . IOLTS, page 253-257. IEEE Computer Society, (2008)

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Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Huang

 

Other publications of authors with the same name

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning., , , , and . ISSCC, page 308-310. IEEE, (2018)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller., , , , , , , , and . J. Electron. Test., 29 (4): 609-616 (2013)Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser., , , , , , , , and . J. Electron. Test., 30 (1): 149-154 (2014)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies., , , , , , and . IRPS, page 1-5. IEEE, (2019)Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms., , , , , , , and . FPL, page 282-285. IEEE Computer Society, (2011)Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment., , , , , , , , , and 1 other author(s). IRPS, page 7. IEEE, (2022)Traffic Anomaly Detection Via Conditional Normalizing Flow., , , , and . ITSC, page 2563-2570. IEEE, (2022)Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS., , , , , , and . CICC, page 1-4. IEEE, (2011)RIIF - Reliability information interchange format., , , , and . IOLTS, page 103-108. IEEE Computer Society, (2012)