( en | de | ru )

 

Disambiguation of "Amat, Esteve"

Author of the publication

copydeleteadd this publication to your clipboard
SET and noise fault tolerant circuit design techniques: Application to 7 nm FinFET.

, , , , and . Microelectron. Reliab., 54 (4): 738-745 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Amat Kane

Philippe Amat

Laure Amate

Reja Amatya

Soven Amatya

 

Other publications of authors with the same name

Variability Influence on FinFET-Based On-Chip Memory Data Paths., , , and . J. Low Power Electron., 11 (2): 250-255 (2015)SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors., , , , , , , and . Microelectron. Reliab., 50 (9-11): 1263-1266 (2010)Influence of the SiO2 layer thickness on the degradation of HfO2/SiO2 stacks subjected to static and dynamic stress conditions., , , , and . Microelectron. Reliab., 47 (4-5): 544-547 (2007)SET and noise fault tolerant circuit design techniques: Application to 7 nm FinFET., , , , and . Microelectron. Reliab., 54 (4): 738-745 (2014)Modem Gain-Cell Memories in Advanced Technologies., , and . IOLTS, page 65-68. IEEE, (2018)RRAM variability and its mitigation schemes., , , and . PATMOS, page 141-146. IEEE, (2016)Variability robustness enhancement for 7nm FinFET 3T1D-DRAM cells., , , , and . MWSCAS, page 81-84. IEEE, (2013)Design and implementation of an adaptive proactive reconfiguration technique for SRAM caches., , , and . DATE, page 1303-1306. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme., , and . ECCTD, page 1-4. IEEE, (2015)UTBB FDSOI technology flexibility for ultra low power internet-of-things applications., , , , , and . ESSDERC, page 164-167. IEEE, (2015)