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K. Chakrabarty, M. Alioto, B. Baas, C. Boon, M. Chang, N. Chang, Y. Chang, C. Chang, S. Chang, P. Chen, M. Chowdhury, P. Corsonello, I. Elfadel, S. Hamdioui, M. Hashimoto, T. Ho, H. Homayoun, Y. Hwang, R. Joshi, T. Karnik, M. Kermani, C. Kim, T. Kim, J. Kulkarni, E. Kursun, E. Larsson, H. Li, H. Li, P. Mercier, P. Mishra, M. Nagata, A. Natarajan, K. Nii, P. Pande, I. Savidis, M. Seok, S. Tan, M. Tehranipoor, A. Todri-Sanial, M. Velev, X. Wen, J. Xu, W. Zhang, Z. Zhang, and S. Jackson. IEEE Trans. Very Large Scale Integr. Syst., 25 (1): 1-20 (2017)

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Li Li

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Task Scheduling in Cloud Computing Based on Cross Entropy Method.Y. Ren, L. Zhou, and H. Li. GRMSE (1), volume 698 of Communications in Computer and Information Science, page 196-202. Springer, (2016)SASH: Efficient secure aggregation based on SHPRG for federated learning.Z. Liu, S. Chen, J. Ye, J. Fan, H. Li, and X. Li. UAI, volume 180 of Proceedings of Machine Learning Research, page 1243-1252. PMLR, (2022)Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors.W. Li, Y. Wang, K. Zou, H. Li, and X. Li. ATS, page 1-6. IEEE, (2023)SeGa: A Trojan Detection Method Combined With Gate Semantics.Y. Ye, S. Li, H. Shen, H. Li, and X. Li. ATS, page 43-48. IEEE, (2021)Low-cost rapid prototyping of flexible plastic paper based microfluidic devices.Y. Fan, H. Li, Y. Yi, and I. Foulds. NEMS, page 175-178. IEEE, (2013)BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.Y. Zhang, Y. Ding, Z. Peng, H. Li, M. Fujita, and J. Jiang. IEEE Trans. Very Large Scale Integr. Syst., 30 (11): 1677-1690 (2022)DHSA: efficient doubly homomorphic secure aggregation for cross-silo federated learning.Z. Liu, S. Chen, J. Ye, J. Fan, H. Li, and X. Li. J. Supercomput., 79 (3): 2819-2849 (2023)SATAM: A SAT Attack Resistant Active Metering Against IC Overbuilding.A. Cui, Z. Weng, H. Zhang, G. Qu, and H. Li. IEEE Trans. Emerg. Top. Comput., 10 (4): 2025-2041 (2022)Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time.Y. Hu, Y. Han, X. Li, H. Li, and X. Wen. IEICE Trans. Inf. Syst., 89-D (10): 2616-2625 (2006)Reliability Analysis of Vision Transformers.X. Xue, C. Liu, Y. Wang, B. Yang, T. Luo, L. Zhang, H. Li, and X. Li. CoRR, (2023)

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Disambiguation of "Li, Huawei"

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Please choose a person to relate this publication to

Li Li

Li Li

Li Li

Li Li

Li Li

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Li, Huawei"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Editorial.

Please choose a person to relate this publication to

Li Li

Li Li

Li Li

Li Li

Li Li

Other publications of authors with the same name

Disambiguation

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URL
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Chicago
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Editorial.