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Disambiguation of "Toifl, Thomas"

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F6: Optical and Electrical Transceivers for 400GbE and Beyond.

, , , , , , , and . ISSCC, page 533-536. IEEE, (2021)

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Caroline Toifl

Gerald Toifl

Thomas Thomas

Thomas Harasim

Die Rolle des nucleostemin-Gens in dem Prozess der Ribosomenbiogenese. Uni München, (2009)

Thomas Baron

Untersuchungen an ungeschädigten und durch Pilzbefall geschädigten Nadelholzbauteilen mit ausgewählten Prüfverfahren. TU Dresden, (2009)
 

Other publications of authors with the same name

A 2.6 mW/Gbps 12.5 Gbps RX With 8-Tap Switched-Capacitor DFE in 32 nm CMOS., , , , , , , , , and 3 other author(s). IEEE J. Solid State Circuits, 47 (4): 897-910 (2012)Adaptive high-speed and ultra-low power optical interconnect for data center communications., , , , , , , and . ICTON, page 1-4. IEEE, (2017)F5: Enabling New System Architectures with 2.5D, 3D, and Chiplets., , , , , and . ISSCC, page 529-532. IEEE, (2021)Analysis of parameter-independent PLLs with bang-bang phase-detectors., , , and . ICECS, page 299-302. IEEE, (1998)A 5.7mW/Gb/s 24-to-240Ω 1.6Gb/s thin-oxide DDR transmitter with 1.9-to-7.6V/ns clock-feathering slew-rate control in 22nm CMOS., , , , , , , , and . ISSCC, page 310-311. IEEE, (2013)23.6 A 30Gb/s 0.8pJ/b 14nm FinFET receiver data-path., , , , , , , , , and 1 other author(s). ISSCC, page 408-409. IEEE, (2016)A 24-to-72GS/s 8b time-interleaved SAR ADC with 2.0-to-3.3pJ/conversion and >30dB SNDR at nyquist in 14nm CMOS FinFET., , , , , , , , , and . ISSCC, page 358-360. IEEE, (2018)Design Techniques for High-Speed Multi-Level Viterbi Detectors and Trellis-Coded-Modulation Decoders., , , , , , , , , and 3 other author(s). IEEE Trans. Circuits Syst. I Regul. Pap., 65-I (10): 3529-3542 (2018)Low-Complexity Adaptive Equalization for High-Speed Chip-to-Chip Communication Paths by Zero-Forcing of Jitter Components., , and . IEEE Trans. Commun., 54 (9): 1554-1557 (2006)A 4.5mW/Gb/s 6.4Gb/s 22+1-lane source-synchronous link rx core with optional cleanup PLL in 65nm CMOS., , , , , , and . ISSCC, page 160-161. IEEE, (2010)