Author of the publication

Impact of die thinning on the thermal performance of a central TSV bus in a 3D stacked circuit.

, , , , , , and . Microelectron. J., 46 (12): 1106-1113 (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Band-Stop Filter Effect of Power/Ground Plane on Through-Hole Signal Via in Multilayer PCB., , , and . IEICE Trans. Electron., 89-C (4): 551-559 (2006)PDN impedance analysis of TSV-decoupling capacitor embedded Silicon interposer for 3D-integrated CMOS image sensor system., , , , , , , , , and 2 other author(s). 3DIC, page 1-4. IEEE, (2011)SrTiO3 thin film decoupling capacitors on Si interposers for 3D system integration., , , , , and . 3DIC, page 1-5. IEEE, (2009)Investigation of effects of metalization on heat spreading in bump-bonded 3D systems., , and . 3DIC, page TS8.30.1-TS8.30.4. IEEE, (2015)Validation of TSV thermo-mechanical simulation by stress measurement., , , , and . Microelectron. Reliab., (2016)Ultralow impedance evaluation system of wideband frequency for power distribution network of decoupling capacitor embedded substrates., , , , , , , , , and 1 other author(s). 3DIC, page 1-4. IEEE, (2009)Hot spots suppression by high thermal conductivity film in thin-sub strate CMOS ICs for 3D integration., , , and . 3DIC, page 1-4. IEEE, (2011)Investigation of optimized high-density flip-chip interconnect design including micro Au bumps for 3-D stacked LSI packaging., , , , , , and . 3DIC, page 1-4. IEEE, (2013)3 Dimensional stacked pixel detector and sensor technology using less than 3-μmφ robust bump junctions., , , , , , and . 3DIC, page 1-4. IEEE, (2016)Guard-ring monitoring system for inspecting defects in TSV-based data buses., , and . 3DIC, page TS8.18.1-TS8.18.5. IEEE, (2015)