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Disambiguation of "Cheng, Ken Chau-Cheung"

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Wafer Defect Pattern Classification with Explainable-Decision Tree Technique.

, , , , , , , and . ITC, page 549-553. IEEE, (2022)

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Cheng-Ken Chen

Ken Lau

Ken Endo

Giselle Cheung

Tobias Cheung

 

Other publications of authors with the same name

PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques., , , , , , and . ETS, page 1-6. IEEE, (2020)TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning., , , , , , , and . ITC, page 1-6. IEEE, (2019)Integrated Scratch Marker for Wafer Defect Diagnosis., , , , , and . ITC-Asia, page 1-4. IEEE, (2021)Innovative Practice on Wafer Test Innovations., , , , , , , , , and . VTS, page 1. IEEE, (2020)Wafer Defect Pattern Classification with Explainable-Decision Tree Technique., , , , , , , and . ITC, page 549-553. IEEE, (2022)Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis., , , , , , , , , and 2 other author(s). DATE, page 1710-1711. IEEE, (2020)Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering., , , , , , , , , and 2 other author(s). ETS, page 1-2. IEEE, (2021)WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques., , , , , , , and . ITC, page 309-313. IEEE, (2021)TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning., , , , , , , and . ITC, page 1-4. IEEE, (2020)