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An effective methodology for on-line testing of embedded microprocessors.

, , , and . IOLTS, page 270-275. IEEE Computer Society, (2011)

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Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , and . VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 130-151. Springer, (2016)SW-based transparent in-field memory testing., , , and . LATS, page 1-6. IEEE Computer Society, (2015)Cumulative embedded memory failure bitmap display & analysis., , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase., , , and . Asian Test Symposium, page 227-232. IEEE Computer Society, (2013)An I-IP based approach for the monitoring of NBTI effects in SoCs., , , , , , and . IOLTS, page 15-20. IEEE Computer Society, (2009)On the in-field test of embedded memories., , , and . IOLTS, page 67-70. IEEE, (2017)An effective methodology for on-line testing of embedded microprocessors., , , and . IOLTS, page 270-275. IEEE Computer Society, (2011)A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions., , , , , and . VTS, page 389-394. IEEE Computer Society, (2008)An Integrated Approach for Increasing the Soft-Error Detection Capabilities in SoCs processors., , , , and . DFT, page 445-453. IEEE Computer Society, (2005)