( en | de | ru )

 

Disambiguation of "Hlawiczka, Andrzej"

Author of the publication

copydeleteadd this publication to your clipboard
Efficient test pattern generators based on specific cellular automata structures.

, and . Microelectron. Reliab., 42 (6): 975-983 (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Helmut Hlawiczka

Andrzej Szplit

Andrzej Tamborek

Andrzej Szczerbakow

Andrzej Lingas

 

Other publications of authors with the same name

Optimized Synthesis of Self-Testable Finite State Machines (FSM) Using BIST-PST Structures in Altera Structures., and . FPL, volume 849 of Lecture Notes in Computer Science, page 120-122. Springer, (1994)Test-per-Clock Detection, Localization and Identification of Interconnect Faults., , , and . ETS, page 233-238. IEEE Computer Society, (2006)Parallel Signature Analyzers Using Hybrid Design of Their Linear Feedbacks.. IEEE Trans. Computers, 41 (12): 1562-1571 (1992)Efficient test pattern generators based on specific cellular automata structures., and . Microelectron. Reliab., 42 (6): 975-983 (2002)Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor., , , , , and . J. Electron. Test., 20 (1): 109-122 (2004)Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path., , and . ETW, page 161-166. IEEE Computer Society, (2000)Compression of multiple-valued data serial streams by means of parallel LFSR signature analyzer.. Fehlertolerierende Rechensysteme, volume 84 of Informatik-Fachberichte, page 404-416. Springer, (1984)Low Cost Bist for Edac Circuits., and . Asian Test Symposium, page 410-415. IEEE Computer Society, (1997)Interconnect Faults Identification and Localization Using Modified Ring LFSRs., , , and . DDECS, page 247-250. IEEE Computer Society, (2008)Comments on "Procedures for Eliminating Static and Dynamic-Hazards in Test Generation".. IEEE Trans. Computers, 27 (2): 191 (1978)