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Другие публикации лиц с тем же именем

Multivariate outlier modeling for capturing customer returns - How simple it can be., , , и . IOLTS, стр. 164-169. IEEE, (2014)Discovering Interesting Plots in Production Yield Data Analytics., , , и . CoRR, (2018)Functional test content optimization for peak-power validation - An experimental study., , , и . ITC, стр. 1-10. IEEE Computer Society, (2012)Primitive Concept Identification In A Given Set Of Wafer Maps., , , и . VLSI-DAT, стр. 1-4. IEEE, (2019)Forward prediction based on wafer sort data - A case study., , , , и . ITC, стр. 1-10. IEEE Computer Society, (2011)Wafer Pattern Recognition Using Tucker Decomposition., , , и . VTS, стр. 1-6. IEEE, (2019)Deploying A Machine Learning Solution As A Surrogate., , , и . ITC, стр. 1-10. IEEE, (2019)An experiment of burn-in time reduction based on parametric test analysis., , и . ITC, стр. 1-10. IEEE Computer Society, (2012)Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits., , , , и . DATE, стр. 794-799. IEEE, (2011)Novel test detection to improve simulation efficiency - A commercial experiment., , , , , и . ICCAD, стр. 101-108. ACM, (2012)